Test
Systems
Systems
SYSTEMS
WHAT IS MITS?
Medical Implant Test Systems (MITS) simulate high-precision maximum incident fields as generated by RF and gradient coils from commercial MR scanners. They are the ultimate and efficient way to test implant compliance.
MITS1.5
Low to maximum incident RF fields with user-defined modulations in a well-controlled environment as generated by commercial 1.5 Tesla MR scanners.
MITS3.0
Low to maximum incident RF fields with user-defined modulations in a well-controlled environment as generated by commercial 3.0 Tesla MR scanners.
MITS GRADIENT
Low to maximum LF fields with user-defined gradient sequences in a well-controlled environment as generated by the gradient coils of commercial MR scanners.